Speaker
Description
Results of single-shot temporal characterization of ultra-short XUV pulses generated by the free-electron laser FLASH will be presented. Using a THz field-driven streaking setup, the limits of this technique were investigated by employing different pulse durations from sub 10 fs to 350fs and different XUV wavelengths. Limits and possible error sources of the diagnostic method are discussed. Furthermore, the single-shot XUV pulse duration measurement allows the detailed investigation of the interplay between different properties of the strongly fluctuating self-amplified spontaneous emission (SASE) radiation. Correlations between pulse duration, pulse energy, spectral distribution and arrival time are explored in the experimental data as well as in simulations. Finally, an outlook on how such a system can be implemented as online photon diagnostic will be presented.
Short info on the speaker:
Studied in Würzburg and Austin, TX
PhD in Jena on laser plasma physics
Since 2003 member of the FLASH photon diagnostics team
Interests: Ultrafast dynamics, ultrahigh intensity interactions and AMO physics
