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Future Detectors for the European XFEL
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Europe/Berlin
XHQ 1.173 (European XFEL GmbH)
XHQ 1.173
European XFEL GmbH
Description
Overview:
The European XFEL facility produces brilliant X-ray flashes with unprecedented brilliance and pulse duration. To fully exploit the capabilities of the European XFEL, the scientific community demands increasingly advanced and sophisticated detectors. The workshop "Future Detectors for the European XFEL" will take place at the European XFEL premises in Schenefeld, Germany on September 18-19, 2023, with the aim of identifying possible technology solutions that can be deployed in detector development for future upgrades of the scientific instruments and of the facility within a timeline of 7-10 years.
The workshop will bring together detector developers to discuss novel techniques that can leverage the new challenges of the facility. These include operation with very hard X-rays (>30-40 keV) and MHz detector operation in burst mode at high pulse intensity.
Workshop organizing committee:
Prof. Dr. Matteo Porro (EuXFEL)
Dr. Marco Ramilli (EuXFEL)
Dr. Jolanta Sztuk-Dambietz (EuXFEL)
Dr. Monica Turcato (EuXFEL)
The workshop will start on Monday 18th at 9 am and end on Tuesday 19th at approximately 5 pm.
Support: Monica Turcato, Nicoletta Mattioli
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09:00
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10:00
Welcome Coffee 1h XHQ 1.173
XHQ 1.173
European XFEL GmbH
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10:00
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11:00
Welcome and Introduction XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Steve Aplin-
10:00
Welcome and Goals of the Workshop 10mSpeaker: Monica Turcato (Eur.XFEL (European XFEL))
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10:10
EuXFEL Facility Development Plans 25mSpeaker: Thomas Tschentscher (Eur.XFEL (European XFEL))
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10:35
Scientific Requirements for Detector Development from EuXFEL Instruments 25mSpeaker: Richard Bean (Eur.XFEL (European XFEL))
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10:00
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11:00
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11:20
Break 20m XHQ 1.173
XHQ 1.173
European XFEL GmbH
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11:20
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13:00
Towards the New Generation of Detectors for the EuXFEL XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Marco Ramilli-
11:20
Operational Experience and Lessons Learned with Existing Detectors (Hardware, Interlocks and Calibration) 25mSpeaker: Jolanta Sztuk-Dambietz (Eur.XFEL (European XFEL))
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11:45
Operational Experience and Lessons Learned with Existing Detectors ( Control and DAQ) 25mSpeakers: Dr Andrea Parenti (Eur.XFEL (European XFEL)), Mr Cyril Danilevski (European XFEL)
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12:10
Data Volume Management: Challenges and Solutions 25mSpeaker: Krzysztof Wrona (Eur.XFEL (European XFEL))
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12:35
New Generation Detectors: Requirements, Strategy and First Steps 25mSpeaker: Monica Turcato (Eur.XFEL (European XFEL))
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11:20
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13:00
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14:00
Lunch 1h XHQ 1.173
XHQ 1.173
European XFEL GmbH
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14:00
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15:40
Front-End Detector Developments I XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Peter Fischer-
14:00
DESY FS-DS: Ongoing Development and Future Directions 25mSpeaker: Heinz Graafsma (FS-DS (Detektorsysteme))
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14:25
Overview of Jungfrau improvements in the short and long term: a EU-XFEL perspective 25mSpeaker: Aldo Mozzanica (Paul Scherrer Institut)
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14:50
Gotthard for CW operation and low/high energy sensor development 25mSpeaker: Jiaguo Zhang (Paul Scherrer Institut)
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15:15
New X-ray Detectors for ESRF: XIDyn/XIDER/Dynamix 25mSpeaker: Paolo Busca
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14:00
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15:40
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16:00
Coffee Break 20m XHQ 1.173
XHQ 1.173
European XFEL GmbH
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16:00
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17:40
Front-End Detector Developments II XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Torsten Laurus-
16:00
From DSSC to to the next generation of soft X-Ray detectors 25mSpeaker: Matteo Porro (European XFEL GmbH)
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16:25
Polimi's Experience Towards Development of New Front-End Solutions for Next-Gen EuXFEL Detectors 25mSpeaker: Carlo Fiorini (Politecnico di Milano and INFN Milano)
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16:50
Front-End Electronics and IP Blocks in 65 nm CMOS Technology for Pixel Detectors in X-ray Imaging Applications 25mSpeaker: Luigi Gaioni
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17:15
Development of Front-End Electronics in 28 nm CMOS Technology 25mSpeaker: Luigi Gaioni
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16:00
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17:45
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18:10
DAQ and firmware development XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Monica Turcato-
17:45
ESRF's RASHPA: High-Performance DAQ Platform 25mSpeaker: Pablo Fajardo (ESRF)
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17:45
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19:15
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21:15
Dinner at BeamStop 2h BeamStop
BeamStop
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09:00
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10:00
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08:30
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09:00
Coffee 30m XHQ 1.173
XHQ 1.173
European XFEL GmbH
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09:00
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10:15
Sensor Developments I XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Richard Hall-Wilton-
09:00
Current and future developments for soft X-ray detectors at MPG HLL 25mSpeaker: Jelena Ninkovic (MPG HLL)
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09:25
The Future of DePFETs (and other devices) for XFELs and Synchrotrons 25mSpeaker: Lothar Strüder (PNS)
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09:50
Characteristics of ARCADIA Fully Depleted MAPS and Perspectives for X-ray Imaging at XFELs 25mSpeaker: Lucio Pancheri (University of Trento)
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09:00
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10:15
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10:45
Coffee Break 30m XHQ 1.173
XHQ 1.173
European XFEL GmbH
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10:45
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12:00
Sensor Developments II XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Bernd Schmitt-
10:45
Overview of Silicon Sensor Development and SDDs for X-ray Spectroscopy at FBK 25mSpeaker: Giancarlo Pepponi (FBK)
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11:10
Development of LGADs and Pixel Sensors for Soft X-rays at FBK 25mSpeaker: Matteo Centis Vignali (FBK)
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11:35
Characterisation of High-Z Sensor Materials for Imaging at Extreme Fluxes 25mSpeaker: Matthew Veale (STFC Rutherford Appleton Laboratory)
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10:45
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12:00
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13:00
Lunch 1h XHQ 1.173
XHQ 1.173
European XFEL GmbH
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13:00
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14:00
DAQ and Firmware Developments XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Steffen Hauf-
13:00
Latest Developments in Detector Microelectronics and DAQ at STFC 30mSpeaker: Matthew Hart (STFC)
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13:30
Enabling Modular and Programmable DAQ at High Frame-Rate and 4 Mega Pixel-Count Imaging for XFEL 2030+: A Competence Driven Assessmen 30mSpeaker: Nicola Lusardi (Politecnico di Milano)
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13:00
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14:00
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14:30
Coffee Break 30m XHQ 1.173
XHQ 1.173
European XFEL GmbH
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14:30
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16:10
X-ray Detector Industry Presentations XHQ 1.173
XHQ 1.173
European XFEL GmbH
Convener: Chair: Jolanta Sztuk-Dambietz-
14:30
DECTRIS: Next Generation MHz Detectors with High Dynamic Range 25mSpeaker: Michael Rissi (DECTRIS Ltd.)
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14:55
High speed X-ray detectors by X-Spectrum 25mSpeaker: Julian Schmehr (X-SPECTRUM)
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15:20
High-Z GaAs Development by ADVAFAB 25mSpeaker: Juha Kalliopuska (Advafab)
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15:45
CdZnTe Detector Technology for Emerging applications in advanced X-Ray sources 25mSpeaker: Glen Wu (Redlen Technologies Inc.)
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14:30
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16:10
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17:00
Workshop Wrap-up: Discussion, Conclusions, and Next Steps 50m XHQ 1.173
XHQ 1.173
European XFEL GmbH
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08:30
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09:00
