Future Detectors for the European XFEL
XHQ 1.173
European XFEL GmbH
Overview:
The European XFEL facility produces brilliant X-ray flashes with unprecedented brilliance and pulse duration. To fully exploit the capabilities of the European XFEL, the scientific community demands increasingly advanced and sophisticated detectors. The workshop "Future Detectors for the European XFEL" will take place at the European XFEL premises in Schenefeld, Germany on September 18-19, 2023, with the aim of identifying possible technology solutions that can be deployed in detector development for future upgrades of the scientific instruments and of the facility within a timeline of 7-10 years.
The workshop will bring together detector developers to discuss novel techniques that can leverage the new challenges of the facility. These include operation with very hard X-rays (>30-40 keV) and MHz detector operation in burst mode at high pulse intensity.
Workshop organizing committee:
Prof. Dr. Matteo Porro (EuXFEL)
Dr. Marco Ramilli (EuXFEL)
Dr. Jolanta Sztuk-Dambietz (EuXFEL)
Dr. Monica Turcato (EuXFEL)
The workshop will start on Monday 18th at 9 am and end on Tuesday 19th at approximately 5 pm.
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09:00
Welcome Coffee XHQ 1.173
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European XFEL GmbH
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Welcome and Introduction XHQ 1.173
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European XFEL GmbH
Convener: Chair: Steve Aplin-
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Welcome and Goals of the WorkshopSpeaker: Monica Turcato (Eur.XFEL (European XFEL))
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EuXFEL Facility Development PlansSpeaker: Thomas Tschentscher (Eur.XFEL (European XFEL))
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3
Scientific Requirements for Detector Development from EuXFEL InstrumentsSpeaker: Richard Bean (Eur.XFEL (European XFEL))
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11:00
Break XHQ 1.173
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European XFEL GmbH
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Towards the New Generation of Detectors for the EuXFEL XHQ 1.173
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European XFEL GmbH
Convener: Chair: Marco Ramilli-
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Operational Experience and Lessons Learned with Existing Detectors (Hardware, Interlocks and Calibration)Speaker: Jolanta Sztuk-Dambietz (Eur.XFEL (European XFEL))
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5
Operational Experience and Lessons Learned with Existing Detectors ( Control and DAQ)Speakers: Dr Andrea Parenti (Eur.XFEL (European XFEL)), Mr Cyril Danilevski (European XFEL)
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Data Volume Management: Challenges and SolutionsSpeaker: Krzysztof Wrona (Eur.XFEL (European XFEL))
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7
New Generation Detectors: Requirements, Strategy and First StepsSpeaker: Monica Turcato (Eur.XFEL (European XFEL))
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4
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13:00
Lunch XHQ 1.173
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European XFEL GmbH
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Front-End Detector Developments I XHQ 1.173
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European XFEL GmbH
Convener: Chair: Peter Fischer-
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DESY FS-DS: Ongoing Development and Future DirectionsSpeaker: Heinz Graafsma (FS-DS (Detektorsysteme))
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9
Overview of Jungfrau improvements in the short and long term: a EU-XFEL perspectiveSpeaker: Aldo Mozzanica (Paul Scherrer Institut)
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10
Gotthard for CW operation and low/high energy sensor developmentSpeaker: Jiaguo Zhang (Paul Scherrer Institut)
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New X-ray Detectors for ESRF: XIDyn/XIDER/DynamixSpeaker: Paolo Busca
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15:40
Coffee Break XHQ 1.173
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European XFEL GmbH
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Front-End Detector Developments II XHQ 1.173
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European XFEL GmbH
Convener: Chair: Torsten Laurus-
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From DSSC to to the next generation of soft X-Ray detectorsSpeaker: Matteo Porro (European XFEL GmbH)
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13
Polimi's Experience Towards Development of New Front-End Solutions for Next-Gen EuXFEL DetectorsSpeaker: Carlo Fiorini (Politecnico di Milano and INFN Milano)
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14
Front-End Electronics and IP Blocks in 65 nm CMOS Technology for Pixel Detectors in X-ray Imaging ApplicationsSpeaker: Luigi Gaioni
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15
Development of Front-End Electronics in 28 nm CMOS TechnologySpeaker: Luigi Gaioni
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12
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DAQ and firmware development XHQ 1.173
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European XFEL GmbH
Convener: Chair: Monica Turcato-
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ESRF's RASHPA: High-Performance DAQ PlatformSpeaker: Pablo Fajardo (ESRF)
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16
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19:15
Dinner at BeamStop BeamStop
BeamStop
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09:00
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08:30
Coffee XHQ 1.173
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European XFEL GmbH
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Sensor Developments I XHQ 1.173
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European XFEL GmbH
Convener: Chair: Richard Hall-Wilton-
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Current and future developments for soft X-ray detectors at MPG HLLSpeaker: Jelena Ninkovic (MPG HLL)
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The Future of DePFETs (and other devices) for XFELs and SynchrotronsSpeaker: Lothar Strüder (PNS)
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19
Characteristics of ARCADIA Fully Depleted MAPS and Perspectives for X-ray Imaging at XFELsSpeaker: Lucio Pancheri (University of Trento)
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10:15
Coffee Break XHQ 1.173
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European XFEL GmbH
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Sensor Developments II XHQ 1.173
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European XFEL GmbH
Convener: Chair: Bernd Schmitt-
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Overview of Silicon Sensor Development and SDDs for X-ray Spectroscopy at FBKSpeaker: Giancarlo Pepponi (FBK)
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Development of LGADs and Pixel Sensors for Soft X-rays at FBKSpeaker: Matteo Centis Vignali (FBK)
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Characterisation of High-Z Sensor Materials for Imaging at Extreme FluxesSpeaker: Matthew Veale (STFC Rutherford Appleton Laboratory)
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20
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12:00
Lunch XHQ 1.173
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European XFEL GmbH
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DAQ and Firmware Developments XHQ 1.173
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European XFEL GmbH
Convener: Chair: Steffen Hauf-
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Latest Developments in Detector Microelectronics and DAQ at STFCSpeaker: Matthew Hart (STFC)
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Enabling Modular and Programmable DAQ at High Frame-Rate and 4 Mega Pixel-Count Imaging for XFEL 2030+: A Competence Driven AssessmenSpeaker: Nicola Lusardi (Politecnico di Milano)
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23
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14:00
Coffee Break XHQ 1.173
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European XFEL GmbH
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X-ray Detector Industry Presentations XHQ 1.173
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European XFEL GmbH
Convener: Chair: Jolanta Sztuk-Dambietz-
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DECTRIS: Next Generation MHz Detectors with High Dynamic RangeSpeaker: Michael Rissi (DECTRIS Ltd.)
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High speed X-ray detectors by X-SpectrumSpeaker: Julian Schmehr (X-SPECTRUM)
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High-Z GaAs Development by ADVAFABSpeaker: Juha Kalliopuska (Advafab)
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CdZnTe Detector Technology for Emerging applications in advanced X-Ray sourcesSpeaker: Glen Wu (Redlen Technologies Inc.)
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Workshop Wrap-up: Discussion, Conclusions, and Next Steps XHQ 1.173
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European XFEL GmbH
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08:30